LSI is an innovative technology company offering photometric testing, illumination optics design, research and development, lighting test equipment and lighting test software systems. For three decades CEO Ian Lewin, Ph.D., F.I.E.S., L.C., has led the company to a stellar reputation in the lighting industry, and LSI’s record of independent photometric solutions is well-known by organizations such as IESNA and CIE.
As an approved CALiPER test laboratory for the Energy Star for Solid State Lighting program, Lighting Sciences Inc. is a fully-equipped independent photometric testing laboratory, that also designs and manufactures test equipment. LSI’s photometric equipment enables major manufacturing and governmental lighting systems developers to move forward with in-house test laboratories.
The equipment LSI designs, manufactures, and uses to deliver photometric services includes:
Moving Mirror Goniophotometers
Integrating Spheres
Automotive/Aviation Goniometer
Spectrophotometers
Night Trespass Meters
Telephotometric Luminance Meters
Electrical Test Systems
Lamp Life Testing Systems
Lamp Base Torque Tester
CCD Camera-based Digital Photometry
Retro-reflection Test System
Lamp Photometric System
Integrated Diagnostic Computer Systems
This sophisticated equipment enables LSI’s diverse client base to enjoy the fastest and most comprehensive independent testing services available. Lighting Sciences Inc. is not affiliated with any lighting fixture manufacturer or other corporation, so our results are always independent.
Twenty-six patents and numerous industry honors demonstrate Lighting Sciences’ preeminent position as the world’s most scientifically-advanced developer of photometric measurement systems.
LSI’s staff is the world’s best at delivering independent photometric testing and equipment, product development consulting, and optical design. Whether its clients require equipment to build a lighting laboratory, or accurate independent testing services, LSI has earned a globally-recognized record of “Excellence in Photometrics.”